ALL CATEGORIES
COMPANY INFO
Delivery Fee : $0.00
Quantity :
Part NO. : | DCFBG-series |
Datasheet : | |
Availability : |
LEOI-30 Diffraction Intensity Measurement System - Complete Model
Description
This system can be used to quantitatively investigate diffraction
effects. To capture and analyze diffraction patterns, a photocell is used to
transform diffraction pattern into current which is displayed by a LED. The
intensity distribution of diffraction can be plotted with the numerical data
recorded. This experiment can help students understand the wave nature of light
and improve their experimental skills.
Feathure
Stable performance with easy operation
LED display with accurate reading
Including He-Ne laser and photodetector with amplifier
Complete system
Application
Fraunhofer Diffraction (Far-field)
a.
Fraunhofer diffraction through a single-slit
b. Fraunhofer diffraction through a multi-slit plate
c. Fraunhofer diffraction through a single circular aperture
d. Fraunhofer diffraction through a transmission grating
Fresnel Diffraction (Near-field)
a. Fresnel diffraction through a single-slit
b. Fresnel diffraction through a multi-slit plate
c. Fresnel diffraction through a circular aperture
d. Fresnel diffraction past a straight edge
Part list
Description |
Specs/Part# |
Qty |
Optical Rail |
1 m, Black anodized aluminum (LEPO-54-1) |
1 |
Carrier |
z axis adjustable (LEPO-54-2) |
2 |
Carrier |
z and x axes adjustable (LEPO-54-3) |
2 |
Carrier |
z, x and y axes adjustable (LEPO-54-4) |
1 |
Transversal Measurement Stage |
Travel: 80 mm, Accuracy: 0.01 mm |
1 |
He-Ne Laser |
>1.0 mW (LLL-2) |
1 |
Lens Holder |
LEPO-9 |
2 |
Plate Holder |
LEPO-13 |
1 |
White Screen |
LEPO-14 |
1 |
Adjustable Slit |
Continuously adjustable from 0-2 mm (LEPO-42) |
1 |
Laser Holder |
LEPO-44 |
1 |
Lens |
f '= 6.2, 150 mm |
1 each |
Multi-slit Plate |
2,3,4,5 slits |
1 |
Multi-hole Plate with Holder |
Chrome plate, 8 holes, 0.1/0.15/0.2/0.3/0.5/0.7/1/2 mm ( dia) |
1 |
Grating |
20 l/mm (with mount) |
1 |
Detector and Amplifier |
20 μW-200 mW (LLM-2) |
1 |
Alignment Aperture |
|
1 |
Fraunhofer diffraction of single slit
Fraunhofer diffraction of multiple slits
Related Items
10um series of optical fiber |
10um series of optical fiber |
10um series of optical fiber |
|
|
Prev product:LEOI-30A Diffraction Intensity Measurement System - Enhanced Model Next product:LEOI-22 Precision Interferometer |