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LEOI-31 Single-Wire/Single-Slit Diffraction
Description
LEOI-31 employs a movable digital photoreceiver to measure the intensity
distribution of optical diffraction. With a focus adjustable semiconductor
laser.
Feathure
Observe single-wire/single-slit diffraction
Measure intensity distribution of diffraction
Confirm relationship between intensity and wavelength
Obtain relationship between intensity and slit width
Verify Heisenberg uncertainty principle and Babinet's principle
Application
a. observe single-wire/single-slit diffraction
b. measure intensity distribution of optical diffraction
c. confirm the relationship between intensity and wavelength
d. obtain the relationship between intensity and slit width
e. verify Heisenberg uncertainty and Babinet's principles
Fraunhofer diffraction of single slit
Semiconductor
Laser
5 mW @ 650 nm
Diffractive
Element
Wire, and
Single Slit (adjustable width)
Description
Qty
Semiconductor
Laser (LLL-1)
1
Optical Rail
(LEPO-54)
1
Carrier
2
White Screen
(LEPO-14)
1
Single-Slit
with Adjustable Width (LEPO-42)
1
Two-Axis
Adjustable Laser Holder (LEPO-20)
1
Photoreceiver
with Amplifier
1 each
Transverse
Measurement Holder
1
Part list
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